Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

Authors:
J. Galiay;Y. Crouzet;M. Vergniault
Affiliations:
Société pour l'Etude et la Fabrication de Circuits Intégrés Spéciaux (EFCIS);-;-
Venue:
IEEE Transactions on Computers
Year:
1980

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Abstract

At the end of an IC production line, integrated circuits are generally submitted to three kinds of tests: 1) parametric tests to check electrical characteristics (voltage, current, power consumption), 2) dynamic tests to check response times under nominal operating conditions, and 3) functional tests to check its logical behavior.