The complexity of design automation problems
DAC '80 Proceedings of the 17th Design Automation Conference
Detecting bridging and stuck-at faults at input and output pins of standard digital components
DAC '80 Proceedings of the 17th Design Automation Conference
Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets
IEEE Transactions on Computers
Polynomially Complete Fault Detection Problems
IEEE Transactions on Computers
On the Detection of Terminal Stuck-Faults
IEEE Transactions on Computers
Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines
IEEE Transactions on Computers
Bounds on the Length of Terminal Stuck-Fault Test
IEEE Transactions on Computers
Hi-index | 14.98 |
In this correspondence we present universal tests for detection of single and multiple stuck-at and bridging faults in combinational and sequential networks.