A cross-layer reliability metric for wireless mesh networks with selfish participants

Authors:
Stefano Paris;Antonio Capone;Cristina Nita-Rotaru;Fabio Martignon
Affiliations:
Politecnico di Milano, Italy;Politecnico di Milano, Italy;Purdue University, Indiana, USA;University of Bergamo, Italy
Venue:
ACM SIGMOBILE Mobile Computing and Communications Review
Year:
2010

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