Robust power gating reactivation by dynamic wakeup sequence throttling

  • Authors:
  • Tung-Yeh Wu;Shih-Hsin Hu;Jacob A. Abraham

  • Affiliations:
  • University of Texas at Austin;University of Texas at Austin and Freescale Semiconductor, Inc.;University of Texas at Austin

  • Venue:
  • Proceedings of the 16th Asia and South Pacific Design Automation Conference
  • Year:
  • 2011

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Abstract

The wakeup sequence for power gating techniques has become an important issue as the rush current typically causes a high voltage drop. This paper proposes a new wakeup scheme utilizing an on-chip detector which continuously monitors the power supply noise in real time. Therefore, this scheme is able to dynamically throttle the wakeup sequence according to ambient voltage level. As a result, even the adjacent active circuit blocks induce an unexpectedly high voltage drop, the possibility of the occurrence of excessive voltage drop is reduced significantly.