IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundaries (GBs) result in significant yield loss, thereby impeding its wide deployment. In this paper, from a system and circuit design perspective, we propose a new self-repair design methodology to compensate the GB-induced variations for LTPS liquid crystal displays (LCDs) and active-matrix organic light emitting diode (AMOLED) displays. The key idea is to extend the charging time for detected low drivability pixel switches, hence, suppressing the brightness non-uniformity and eliminating the need for large voltage margins. The proposed circuit was implemented in VGA LCD panels which were used for prediction of power consumption and yield. Based on the simulation results, the proposed circuit decreases the required supply voltage by 20% without performance and yield degradation. 7% yield enhancement is observed for high resolution, large sized LCDs while incurring negligible power penalty. This technique enables LTPS-based displays either to further scale down the device size for higher integration and lower power consumption or to have superior yield in large sized panels with small power overhead.