An automatic test generation system for illiac IV logic boards

  • Authors:

  • Vishwani D. Agrawal;Prathima Agrawal

  • Affiliations:

  • EG&G, Inc., Albuquerque, N. Mex. and Automation Technologv Inc., Champaign, Ill.;Automation Technologv Inc., Champaign, Ill.

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1972

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Abstract

A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach.