Toward Future Systems with Nanoscale Devices: Overcoming the Reliability Challenge

Authors:
Wenjing Rao;Chengmo Yang;Ramesh Karri;Alex Orailoglu
Affiliations:
University of Illinois at Chicago, Chicago;University of Delaware, Newark;Polytechnic University, Brooklyn;University of California at San Diego, La Jolla
Venue:
Computer
Year:
2011

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Abstract

Nanoelectronic devices are envisioned to deliver major improvements in device density, power, and performance, but turning such promises into reality hinges on overcoming the reliability challenge. At the same time, new characteristics exhibited by nanoscale devices demand rethinking reliability strategies.