SIAM Journal on Computing
P = BPP if E requires exponential circuits: derandomizing the XOR lemma
STOC '97 Proceedings of the twenty-ninth annual ACM symposium on Theory of computing
Checking polynomial identities over any field: towards a derandomization?
STOC '98 Proceedings of the thirtieth annual ACM symposium on Theory of computing
Extractors and pseudo-random generators with optimal seed length
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Pseudorandom generators without the XOR lemma
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Randomness efficient identity testing of multivariate polynomials
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Depth-3 arithmetic circuits over fields of characteristic zero
Computational Complexity
In search of an easy witness: exponential time vs. probabilistic polynomial time
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Primality and identity testing via Chinese remaindering
Journal of the ACM (JACM)
Simple extractors for all min-entropies and a new pseudorandom generator
Journal of the ACM (JACM)
Deterministic polynomial identity testing in non-commutative models
Computational Complexity
Derandomizing polynomial identity tests means proving circuit lower bounds
Computational Complexity
Polynomial Identity Testing for Depth 3 Circuits
Computational Complexity
Locally Decodable Codes with Two Queries and Polynomial Identity Testing for Depth 3 Circuits
SIAM Journal on Computing
Elusive functions and lower bounds for arithmetic circuits
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CCC '08 Proceedings of the 2008 IEEE 23rd Annual Conference on Computational Complexity
Arithmetic Circuits: A Chasm at Depth Four
FOCS '08 Proceedings of the 2008 49th Annual IEEE Symposium on Foundations of Computer Science
An Almost Optimal Rank Bound for Depth-3 Identities
CCC '09 Proceedings of the 2009 24th Annual IEEE Conference on Computational Complexity
The monomial ideal membership problem and polynomial identity testing
ISAAC'07 Proceedings of the 18th international conference on Algorithms and computation
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In this paper we show that lower bounds for bounded depth arithmetic circuits imply derandomization of polynomial identity testing for bounded depth arithmetic circuits. More formally, if there exists an explicit polynomial $f$ that cannot be computed by a depth $d$ arithmetic circuit of small size, then there exists an efficient deterministic black-box algorithm to test whether a given depth $d-5$ circuit that computes a polynomial of relatively small individual degrees is identically zero or not. In particular, if we are guaranteed that the tested circuit computes a multilinear polynomial, then we can perform the identity test efficiently. To the best of our knowledge this is the first hardness-randomness tradeoff for bounded depth arithmetic circuits. The above results are obtained using the arithmetic Nisan-Wigderson generator of Kabanets and Impagliazzo together with a new theorem on bounded depth circuits, which is the main technical contribution of our work. This theorem deals with polynomial equations of the form $P(x_1,\dots,x_n,y)\equiv0$ and shows that if $P$ has a circuit of depth $d$ and size $s$ and if the polynomial $f(x_1,\dots,x_n)$ satisfies $P(x_1,\dots,x_n,f)\equiv0$, then $f$ has a circuit of depth $d+3$ and size $\mathrm{poly}(s,m^r)$, where $m$ is the total degree of $f$ and $r$ is the degree of $y$ in $P$. This circuit for $f$ can be found probabilistically in time $\mathrm{poly}(s,m^r)$. In the other direction we observe that the methods of Kabanets and Impagliazzo can be used to show that derandomizing identity testing for bounded depth circuits implies lower bounds for the same class of circuits. More formally, if we can derandomize polynomial identity testing for bounded depth circuits, then NEXP does not have bounded depth arithmetic circuits. That is, either $\mathrm{NEXP}\not\subseteq P/\mathrm{poly}$ or the Permanent is not computable by polynomial size bounded depth arithmetic circuits.