Polynomial Identity Testing for Depth 3 Circuits

  • Authors:
  • Neeraj Kayal;Nitin Saxena

  • Affiliations:
  • Institute for Advanced Study, Princeton, USA 08540;Centrum voor Wiskunde en Informatica, Amsterdam, The Netherlands 1098 SJ

  • Venue:
  • Computational Complexity
  • Year:
  • 2007

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Abstract

We study the identity testing problem for depth 3 arithmetic circuits ( $$\sum\prod\sum$$ circuit). We give the first deterministic polynomial time identity test for $$\sum\prod\sum$$ circuits with bounded top fanin. We also show that the rank of a minimal and simple $$\sum\prod\sum$$ circuit with bounded top fanin, computing zero, can be unbounded. These results answer the open questions posed by Klivans---Spielman (STOC 2001) and Dvir---Shpilka (STOC 2005).