Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs

  • Authors:

  • Deepa Mannath;David Cohen;Victor Montaño-Martinez;Rick Hudgens;Elida De-Obaldia;Shai Kush;Simon S. Ang

  • Affiliations:

  • The University of Arkansas, Fayetteville, USA 72701 and Texas Instruments, Dallas, USA 75243;Texas Instruments, Ra'anana, Israel;Texas Instruments, Dallas, USA 75243;Texas Instruments, Dallas, USA 75243;Texas Instruments, Dallas, USA 75243;Texas Instruments, Ra'anana, Israel;The University of Arkansas, Fayetteville, USA 72701

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2011

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Abstract

Production testing of Bluetooth (BT) devices is challenging due to the complex nature of the RF tests that have to be performed to verify functionality. In this paper we detail Built-in Self Tests (BiSTs) that can be used to replace these complex and expensive functional tests. We also present the data from our analysis of over 1 million production units. With sufficient margin to specification, we can eliminate functional tests and implement BiSTs that are faster, cheaper and provide better coverage while guaranteeing acceptable Defective Parts Per Million (DPPM) numbers. These BiSTs along with traditional digital tests can completely replace traditional Bluetooth RF tests like Bit Error Rate (BER) and Transmitted (TX) Power.