Production Testing of Rf and System-On-A-Chip Devices for Wireless Communications (Artech House Microwave Library)

Electrical characterization of analogue and RF integrated circuits by thermal measurements

Microelectronics Journal

Practices in Mixed-Signal and RF IC Testing

IEEE Design & Test

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability

An on-chip loopback block for RF transceiver built-in test

IEEE Transactions on Circuits and Systems II: Express Briefs

Built-in loopback test for IC RF transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Methodology to Replace Sensitivity BER and Transmit Power Production Tests in Bluetooth Devices with BiSTs

Journal of Electronic Testing: Theory and Applications

Analog test metrics estimates with PPM accuracy

Proceedings of the International Conference on Computer-Aided Design