Revisiting Application-Dependent Test for FPGA Devices

Authors:
Alessandro Cilardo;Carmelo Lofiego;Antonino Mazzeo;Nicola Mazzocca
Affiliations:
-;-;-;-
Venue:
ETS '11 Proceedings of the 2011 Sixteenth IEEE European Test Symposium
Year:
2011

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ASP-based optimized mapping in a simulink-to-MPSoC design flow

Journal of Systems Architecture: the EUROMICRO Journal

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Abstract

FPGA testing poses a number of challenges related to both the complexity of the device under test and the opportunities introduced by its support to hardware reconfiguration. Application-dependent testing (ADT) provides an effective answer to these challenges. The study presented in this paper identifies some limitations of state-of-the-art ADT approaches, which prevent a complete coverage for bridging faults and the practical applicability of the algorithms for test configuration generation. The work also introduces a set of new techniques that enabled us to overcome these limitations and effectively extend previous methodologies for ADT.