Mean Shift: A Robust Approach Toward Feature Space Analysis
IEEE Transactions on Pattern Analysis and Machine Intelligence
The evaluation of normalized cross correlations for defect detection
Pattern Recognition Letters
Fast normalized cross correlation for defect detection
Pattern Recognition Letters
A quantile-quantile plot based pattern matching for defect detection
Pattern Recognition Letters
A Marked Point Process of Rectangles and Segments for Automatic Analysis of Digital Elevation Models
IEEE Transactions on Pattern Analysis and Machine Intelligence
Morphological segmentation of binary patterns
Pattern Recognition Letters
Object Extraction Using a Stochastic Birth-and-Death Dynamics in Continuum
Journal of Mathematical Imaging and Vision
EMMCVPR '09 Proceedings of the 7th International Conference on Energy Minimization Methods in Computer Vision and Pattern Recognition
Study of PCB Automatic Optical Inspection System Based on Mathematical Morphology
ICCTD '09 Proceedings of the 2009 International Conference on Computer Technology and Development - Volume 02
Unsupervised range-constrained thresholding
Pattern Recognition Letters
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In this paper we introduce a probabilistic approach for optical quality checking of solder pastes (SP) in Printed Circuit Boards (PCB). Dealing with unregistered image inputs, our task is to address at the same time SP identification, and detection of special soldering errors, called scooping. For this reason we introduce a novel Hierarchical Marked Point Process (HMPP) framework, which is able to handle the paste and scooping extraction problems simultaneously, so that the SPs and included scoops have a parent-child relationship. A global optimization process attempts to find the optimal configuration of entities, considering the observed data, prior knowledge, and interactions between the neighboring circuit elements. The proposed method is evaluated on a real PCB image set containing more than 3000 SPs and 600 scooping artifacts. A morphology-based baseline method is also introduced for the problem and used as reference for qualitative and quantitative comparison against the proposed model.