The evaluation of normalized cross correlations for defect detection

Authors:
Du-Ming Tsai;Chien-Ta Lin;Jeng-Fung Chen
Affiliations:
Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Nei-Li, Tao-Yuan 32026, Taiwan, ROC;Department of Industrial Engineering and Management, Yuan-Ze University, 135 Yuan-Tung Road, Nei-Li, Tao-Yuan 32026, Taiwan, ROC;Department of Industrial Engineering, Feng-Chia University, Taiwan, ROC
Venue:
Pattern Recognition Letters
Year:
2003

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Abstract

The normalized cross correlation (NCC) has been used extensively in machine vision for industrial inspection, but the traditional NCC suffers from false alarms for a complicated image that contains partial uniform regions. In this paper, we study the use of NCCs for defect detection in complicated images. The performance of NCCs in monochrome and color images, and the effect of image smoothing are empirically evaluated. The proposed NCC in a smoothed color image can effectively alleviate false alarms in defect detection applications.