C-elements for hardened self-timed circuits

  • Authors:
  • Florent Ouchet;Katell Morin-Allory;Laurent Fesquet

  • Affiliations:
  • TIMA Laboratory, Grenoble INP, UJF, CNRS, France;TIMA Laboratory, Grenoble INP, UJF, CNRS, France;TIMA Laboratory, Grenoble INP, UJF, CNRS, France

  • Venue:
  • PATMOS'11 Proceedings of the 21st international conference on Integrated circuit and system design: power and timing modeling, optimization, and simulation
  • Year:
  • 2011

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Abstract

Self-timed circuits are slope sensitive: when the voltage of one input or internal node changes too slowly, the interconnected logical blocks might loose their local one-to-one synchronization. This phenomenon often leads to unwanted global dead-locks of the entire circuit. The deep-submicronic manufacturing process mismatches might create such situations where one logical block is significantly slower than the others. We applied two known solutions for ensuring the correct Celement behavior whatever the slopes are: the transistors are resized and the supply voltage is reduced in order to guarantee the overall chip correctness taking into account the process variations.