Joint photometric and geometric image registration in the total least square sense

Authors:
Hiêp Quang Luong;Bart Goossens;Aleksandra Piurica;Wilfried Philips
Affiliations:
UGent-TELIN-IPI-IBBT, Sint-Pietersnieuwstraat 41, B-9000 Ghent, Belgium;UGent-TELIN-IPI-IBBT, Sint-Pietersnieuwstraat 41, B-9000 Ghent, Belgium;UGent-TELIN-IPI-IBBT, Sint-Pietersnieuwstraat 41, B-9000 Ghent, Belgium;UGent-TELIN-IPI-IBBT, Sint-Pietersnieuwstraat 41, B-9000 Ghent, Belgium
Venue:
Pattern Recognition Letters
Year:
2011

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Abstract

This paper presents a novel robust image alignment technique that performs joint geometric and photometric registration in the total least square (TLS) sense. Therefore, we employ the total least square metric instead of the ordinary least square (OLS) metric, which is commonly used in the literature. While the OLS model is sufficient to tackle geometric registration problems, it gives no mutually consistent estimates when dealing with photometric deformations. By introducing a new TLS model, we obtain mutually consistent parameters. Experimental results show that our method is indeed more consistent and accurate in presence of noise compared to existing joint registration algorithms.