Low power FPGA design using post-silicon device aging (abstract only)
Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays
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Thanks to their inherent regularity and reconfigurability, FPGAs offer an ideal structure to manage process variability. Recent works from the literature have addressed the process characterization problem for FPGAs: proposed approaches rely on process sensors (ring oscillators) and a measurement subsystem implemented into the configurable logic blocks. In this article, we propose for the first time in the literature a non-invasive characterization method based on electromagnetic analysis. The whole experimental set-up is described and the characterization accuracy is discussed. This paper proves the feasibility of this new method on FPGAs.