Fast irreducibility testing for XTR using a gaussian normal basis of low complexity

  • Authors:
  • Soonhak Kwon;Chang Hoon Kim;Chun Pyo Hong

  • Affiliations:
  • Inst. of Basic Science and Dept. of Mathematics, Sungkyunkwan University, Suwon, Korea;Dept. of Computer and Information Engineering, Daegu University, Kyungsan, Korea;Dept. of Computer and Information Engineering, Daegu University, Kyungsan, Korea

  • Venue:
  • SAC'04 Proceedings of the 11th international conference on Selected Areas in Cryptography
  • Year:
  • 2004

Quantified Score

Hi-index 0.00

Visualization

Abstract

XTR appeared in 2000 is a very promising alternative to elliptic curve cryptosystem. Though the basic idea behind XTR is very elegant and universal, one needs to restrict the primes p such as p ≡ 2 mod3 for optimal normal bases since it involves many multiplications in GF(p2). Moreover the restriction p ≡ 2 mod3 is consistently used to improve the time complexity for irreducibility testing for XTR polynomials. In this paper, we propose that a Gaussian normal basis of type (2,k) for small k can also be used for efficient field arithmetic for XTR when p ≢ 2(mod 3). Furthermore we give a new algorithm for fast irreducibility testing and finding a generator of XTR group when p ≡ 1 mod 3. Also we present an explicit generator of XTR group which does not need any irreducibility testing when there is a Gaussian normal basis of type (2,3) in GF(p2). We show that our algorithms are simple to implement and the time complexity of our methods are comparable to the best ones proposed so far.