Contactless electromagnetic active attack on ring oscillator based true random number generator
COSADE'12 Proceedings of the Third international conference on Constructive Side-Channel Analysis and Secure Design
Fault Analysis and Evaluation of a True Random Number Generator Embedded in a Processor
Journal of Electronic Testing: Theory and Applications
Electromagnetic glitch on the AES round counter
COSADE'13 Proceedings of the 4th international conference on Constructive Side-Channel Analysis and Secure Design
Defeating with fault injection a combined attack resistant exponentiation
COSADE'13 Proceedings of the 4th international conference on Constructive Side-Channel Analysis and Secure Design
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The paper aims at demonstrating experimentally that the tiny Electro Magnetic (EM) coupling between the tip end of a micro-antenna is sufficient to locally and directly inject power into CMOS Integrated Circuits (IC). More precisely, experimental results show that such electrical couplings are sufficient to disturb, with and without removing the IC package, the behavior of 90nm CMOS Ring Oscillators, a representative structure of CMOS logic but also a constituting element of some True Random Number Generators (TRNGs) or clock generator.