Online Fault Detection in Reversible Logic

  • Authors:

  • N. M. Nayeem;J. E. Rice

  • Affiliations:

  • -;-

  • Venue:
  • DFT '11 Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
  • Year:
  • 2011

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Abstract

A new approach for online fault detection in Boolean reversible circuits is described. Previous work had described this approach for circuits generated by the basic ESOP-based logic synthesis, and in this work we extend the approach for any type of Toffoli networks. An online testable circuit is created by modifying an existing cascade of Toffoli gates in a simple process that involves changing the existing Toffoli gates as well as the addition of one line and 2p gates, where p is the number of lines in the original circuit.