Planar object recognition using projective shape representation
International Journal of Computer Vision
Direct Least Square Fitting of Ellipses
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Flexible New Technique for Camera Calibration
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Geometry and Matching of Lines and Curves Over Multiple Views
International Journal of Computer Vision
Autocalibration from Planar Scenes
ECCV '98 Proceedings of the 5th European Conference on Computer Vision-Volume I - Volume I
Multiple View Geometry in Computer Vision
Multiple View Geometry in Computer Vision
Using Conic Correspondences in Two Images to Estimate the Epipolar Geometry
ICCV '98 Proceedings of the Sixth International Conference on Computer Vision
Multiple View Geometry of General Algebraic Curves
International Journal of Computer Vision
Scale-adaptive detection and local characterization of edges based on wavelet transform
Signal Processing - Signal processing in communications
Coplanar circles, quasi-affine invariance and calibration
Image and Vision Computing
Plane-based camera self-calibration by metric rectification of images
Image and Vision Computing
Two-view curve reconstruction based on the snake model
Journal of Computational and Applied Mathematics
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We address the problem of feature correspondences in images of coplanar ellipses with objective to benefit of robust ellipse fitting algorithm. The main difficulty is the lack of projective invariant points immediately available. Therefore, our key idea is to construct virtual line and point features using the property of tangent invariance under perspective projection. The proposed method requires first a robust detection of ellipse edge points to fit a parametric model on each ellipse. The feature lines are then obtained by computing the 4 bitangents to each couple of ellipses. The points are derived by considering the tangent points and the intersection points between bitangents. Results of experimental studies are presented to demonstrate the reliability and robustness of the feature extraction process. Subpixel accuracy is easily achieved. A real application to camera self-calibration is also described.