Background robust face tracking using active contour technique combined active appearance model

  • Authors:
  • Jaewon Sung;Daijin Kim

  • Affiliations:
  • Biometrics Engineering Research Center (BERC), Pohang University of Science and Technology;Biometrics Engineering Research Center (BERC), Pohang University of Science and Technology

  • Venue:
  • ICB'06 Proceedings of the 2006 international conference on Advances in Biometrics
  • Year:
  • 2006

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Abstract

This paper proposes a two stage AAM fitting algorithm that is robust to the cluttered background and a large motion. The proposed AAM fitting algorithm consists of two alternative procedures: the active contour fitting to find the contour sample that best fits the face image and then the active appearance model fitting over the best selected contour. Experimental results show that the proposed active contour based AAM provides better accuracy and convergence characteristics in terms of RMS error and convergence rate, respectively, than the existing robust AAM.