Machine Learning
Support Vector Machines for Texture Classification
IEEE Transactions on Pattern Analysis and Machine Intelligence
Introduction to Data Mining, (First Edition)
Introduction to Data Mining, (First Edition)
Nearest-Neighbor Methods in Learning and Vision: Theory and Practice (Neural Information Processing)
Nearest-Neighbor Methods in Learning and Vision: Theory and Practice (Neural Information Processing)
Pattern Recognition, Third Edition
Pattern Recognition, Third Edition
Image Processing, Analysis, and Machine Vision
Image Processing, Analysis, and Machine Vision
Computers and Electronics in Agriculture
A novel fuzzy rule base system for pose independent faces detection
Applied Soft Computing
IEEE Transactions on Neural Networks
Support vector machine for breast MR image classification
Computers & Mathematics with Applications
Automatic recognition of frog calls using a multi-stage average spectrum
Computers & Mathematics with Applications
A novel color detection method based on HSL color space for robotic soccer competition
Computers & Mathematics with Applications
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Detection of external defects on potatoes is the most important technology in the realization of automatic potato sorting stations. This paper presents a hierarchical grading method applied to the potatoes. In this work a potato defect detection combining with size sorting system using the machine vision will be proposed. This work also will focus on the mathematics methods used in automation with a particular emphasis on the issues associated with designing, implementing and using classification algorithms to solve equations. In the first step, a simple size sorting based on mathematical binarization is described, and the second step is to segment the defects; to do this, color based classifiers are used. All the detection standards for this work are referenced from the United States Agriculture Department, and Canadian Food Industries. Results show that we have a high accuracy in both size sorting and classification. Experimental results show that support vector machines have very high accuracy and speed between classifiers for defect detection.