Three-Dimensional planar profile registration in 3d scanning

  • Authors:
  • João Filipe Ferreira;Jorge Dias

  • Affiliations:
  • Institute of Systems and Robotics, University of Coimbra, Portugal;Institute of Systems and Robotics, University of Coimbra, Portugal

  • Venue:
  • ICIAR'05 Proceedings of the Second international conference on Image Analysis and Recognition
  • Year:
  • 2005

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Abstract

Three-dimensional planar profile sampling of surfaces is a very common method of structural recovery in 3D scanning. In handheld 3D scanners, this has scarcely ever been taken into account resulting in poor precision ratings. Therefore, in this text we will describe a novel use of the profiling geometrical context to derive an intuitive and physically meaningful approach on solving the 3D profile registration problem. We will finish by describing the global optimisation algorithm and by showing experimental results achieved with a 3D scanner prototype comprising a camera, a laser-plane projector and a pose sensor.