High-level restructuring of TTCN-3 test data

Authors:
Antal Wu-Hen-Chang;D ung Le Viet;Gabor Batori;Roland Gecse;Gyula Csopaki
Affiliations:
Department of Telecommunications and Media Informatics, Budapest University of Technology and Economics, Budapest, Hungary;Department of Telecommunications and Media Informatics, Budapest University of Technology and Economics, Budapest, Hungary;Department of Telecommunications and Media Informatics, Budapest University of Technology and Economics, Budapest, Hungary;Conformance Laboratory, Ericsson Hungary Ltd., Budapest, Hungary;Department of Telecommunications and Media Informatics, Budapest University of Technology and Economics, Budapest, Hungary
Venue:
FATES'04 Proceedings of the 4th international conference on Formal Approaches to Software Testing
Year:
2004

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Abstract

TTCN-3 (Testing and Test Control Notation 3) [1,2,3] test suites developed for testing complicated systems contain a large number of test data definitions. These definitions are often redundant and lengthy, which leads to compilation and run-time inefficiencies. Our intention is to provide remedy for this problem, by proposing a method that restructures the test data definitions of an already existing TTCN-3 module. In this paper we introduce a model for TTCN-3 test data and a method for its optimization. The results of an empirical study using our approach is presented as well.