TAV4 Proceedings of the symposium on Testing, analysis, and verification
Elements of information theory
Elements of information theory
Software fault injection: inoculating programs against errors
Software fault injection: inoculating programs against errors
Testability, fault size and the domain-to-range ratio: An eternal triangle
Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis
An Empirical Evaluation of Weak Mutation
IEEE Transactions on Software Engineering
MATRIX: Maintenance-Oriented Testing Requirements Identifier and Examiner
TAIC-PART '06 Proceedings of the Testing: Academic & Industrial Conference on Practice And Research Techniques
Anonymity protocols as noisy channels
Information and Computation
A static analysis for quantifying information flow in a simple imperative language
Journal of Computer Security
An Interval-based Abstraction for Quantifying Information Flow
Electronic Notes in Theoretical Computer Science (ENTCS)
CSF '10 Proceedings of the 2010 23rd IEEE Computer Security Foundations Symposium
Quantifying information leaks in software
Proceedings of the 26th Annual Computer Security Applications Conference
Applying Aggressive Propagation-Based Strategies for Testing Changes
ICST '11 Proceedings of the 2011 Fourth IEEE International Conference on Software Testing, Verification and Validation
Statistical measurement of information leakage
TACAS'10 Proceedings of the 16th international conference on Tools and Algorithms for the Construction and Analysis of Systems
Hi-index | 0.89 |
Fault masking can reduce the effectiveness of a test suite. We propose an information theoretic measure, Squeeziness, as the theoretical basis for avoiding fault masking. We begin by explaining fault masking and the relationship between collisions and fault masking. We then define Squeeziness and demonstrate by experiment that there is a strong correlation between Squeeziness and the likelihood of collisions. We conclude with comments on how Squeeziness could be the foundation for generating test suites that minimise the likelihood of fault masking.