Recovery of an interface from boundary measurement in an elliptic differential equation

Authors:
Weifu Fang;Suxing Zeng
Affiliations:
Department of Mathematics and Statistics, Wright State University, Dayton, USA 45435;Department of Mathematics and Statistics, Wright State University, Dayton, USA 45435
Venue:
Advances in Computational Mathematics
Year:
2012

Citing 3
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Abstract

We study the inverse problem of recovering an interior interface from a boundary measurement in an elliptic boundary value problem arising from a semiconductor transistor model. We set up a nonlinear least-squares formulation for solving the inverse problem, and establish the necessary derivatives with respect to the interface. We then propose both the Gauss---Newton iterative method and the conjugate gradient method for the least-squares problem, and present implementation of these methods using integral equations.