Estimation of Classifier Performance
IEEE Transactions on Pattern Analysis and Machine Intelligence
Introduction to statistical pattern recognition (2nd ed.)
Introduction to statistical pattern recognition (2nd ed.)
NETLAB: algorithms for pattern recognition
NETLAB: algorithms for pattern recognition
An introduction to variable and feature selection
The Journal of Machine Learning Research
A General Model for Finite-Sample Effects in Training and Testing of Competing Classifiers
IEEE Transactions on Pattern Analysis and Machine Intelligence
No Unbiased Estimator of the Variance of K-Fold Cross-Validation
The Journal of Machine Learning Research
Comparison of Non-Parametric Methods for Assessing Classifier Performance in Terms of ROC Parameters
AIPR '04 Proceedings of the 33rd Applied Imagery Pattern Recognition Workshop
An introduction to ROC analysis
Pattern Recognition Letters - Special issue: ROC analysis in pattern recognition
Assessing Classifiers from Two Independent Data Sets Using ROC Analysis: A Nonparametric Approach
IEEE Transactions on Pattern Analysis and Machine Intelligence
Small-sample precision of ROC-related estimates
Bioinformatics
Small-sample precision of ROC-related estimates
Bioinformatics
Assessing classifiers in terms of the partial area under the ROC curve
Computational Statistics & Data Analysis
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We categorize the statistical assessment of classifiers into three levels: assessing the classification performance and its testing variability conditional on a fixed training set, assessing the performance and its variability that accounts for both training and testing, and assessing the performance averaging over training sets and its variability that accounts for both training and testing. We derived analytical expressions for the variance of the estimated AUC and provide freely available software implemented with an efficient computation algorithm. Our approach can be applied to assess any classifier that has ordinal (continuous or discrete) outputs. Applications to simulated and real datasets are presented to illustrate our methods.