JPEG steganalysis using HBCL statistics and FR index

  • Authors:
  • Veena H. Bhat;Krishna S.;P. Deepa Shenoy;Venugopal K. R.;L. M. Patnaik

  • Affiliations:
  • Department of Computer Science and Engineering, University Visvesvaraya College of Engineering, Bangalore, India;Department of Computer Science and Engineering, University Visvesvaraya College of Engineering, Bangalore, India;Department of Computer Science and Engineering, University Visvesvaraya College of Engineering, Bangalore, India;Department of Computer Science and Engineering, University Visvesvaraya College of Engineering, Bangalore, India;Vice Chancellor, Defense Institute of Advanced Technology, Pune, India

  • Venue:
  • PAISI'10 Proceedings of the 2010 Pacific Asia conference on Intelligence and Security Informatics
  • Year:
  • 2010

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Abstract

This paper introduces a new statistical model for blind steganalysis of JPEG images. The functionals used to build this model are based on Huffman Bit Code Lengths (HBCL statistics) and the file size to image resolution ratio (FR Index). JPEG images spanning a wide range of resolutions were used to create a ‘stego-image’ database employing three embedding schemes – the advanced Least Significant Bit encoding technique, JPEG Hide-and-Seek and Model Based Steganography. Existing blind steganalysis techniques mostly involve the analyses of generalized category attacks and the higher order statistics. This work builds an effective neural network prediction model using HBCL statistics and FR Index, which are not yet explored by steganalysts. The experimental results proved to be efficient over a diverse image database and several payloads.