The optimal feature extraction procedure for statistical pattern recognition

Authors:
Marek Kurzynski;Edward Puchala
Affiliations:
Faculty of Electronics, Chair of Systems and Computer Networks, Wroclaw University of Technology, Wroclaw, Poland;Faculty of Electronics, Chair of Systems and Computer Networks, Wroclaw University of Technology, Wroclaw, Poland
Venue:
ICCSA'06 Proceedings of the 2006 international conference on Computational Science and Its Applications - Volume Part III
Year:
2006

Citing 4
Cited 0

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Abstract

The paper deals with the extraction of features for object recognition. Bayes' probability of correct classification was adopted as the extraction criterion. The problem with full probabilistic information is discussed in detail. A simple calculation example is given and solved. One of the paper's chapters is devoted to a case when the available information is contained in the so-called learning sequence (the case of recognition with learning).