A novel test coverage metric for concurrently-accessed software components

Authors:
Serdar Tasiran;Tayfun Elmas;Guven Bolukbasi;M. Erkan Keremoglu
Affiliations:
Koç University, Istanbul, Turkey;Koç University, Istanbul, Turkey;Koç University, Istanbul, Turkey;Koç University, Istanbul, Turkey
Venue:
FATES'05 Proceedings of the 5th international conference on Formal Approaches to Software Testing
Year:
2005

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Abstract

We propose a novel, practical coverage metric called “location pairs” (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.