Concurrent Bug Patterns and How to Test Them

  • Authors:
  • Eitan Farchi;Yarden Nir;Shmuel Ur

  • Affiliations:
  • -;-;-

  • Venue:
  • IPDPS '03 Proceedings of the 17th International Symposium on Parallel and Distributed Processing
  • Year:
  • 2003

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Abstract

We present and categorize a taxonomy of concurrent bug patterns. We then use the taxonomy to create new timing heuristics for ConTest. Initial industrial experience indicates that these heuristics improve the bug finding ability ofConTest. We also show how concurrent bug patterns can be derived from concurrent design patterns. Further research is required to complete the concurrent bug taxonomy and formal experiments are needed to show that heurisitics derived from the taxonomy improve the bug finding ability of ConTest.