Improved fault analysis of signature schemes

  • Authors:
  • Christophe Giraud;Erik W. Knudsen;Michael Tunstall

  • Affiliations:
  • Oberthur Technologies, Pessac, France;Alm. Brand, København Ø, Denmark;Department of Computer Science, University of Bristol, Bristol, United Kingdom

  • Venue:
  • CARDIS'10 Proceedings of the 9th IFIP WG 8.8/11.2 international conference on Smart Card Research and Advanced Application
  • Year:
  • 2010

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Abstract

At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. They showed that 2304 faulty signatures would be expected to reduce the number of possible keys to 240, allowing a 160-bit private key to be recovered. In this paper we show that Giraud and Knudsen's fault attack is much more efficient than originally claimed. We prove that 34.3% less faulty signatures are required to recover a private key using the same fault model. We also show that their original way of expressing the fault model under a system of equations can be improved. A more precise expression allows us to obtain another improvement of up to 47.1%, depending on the values of the key byte affected.