Breaking Public Key Cryptosystems on Tamper Resistant Devices in the Presence of Transient Faults

  • Authors:
  • Feng Bao;Robert H. Deng;Yongfei Han;Albert B. Jeng;A. Desai Narasimhalu;Teow-Hin Ngair

  • Affiliations:
  • -;-;-;-;-;-

  • Venue:
  • Proceedings of the 5th International Workshop on Security Protocols
  • Year:
  • 1997

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Abstract