Performance simulation of nanoscale silicon rod field-effect transistor logic

  • Authors:
  • C. Dwyer;L. Vicci;R. M. Taylor

  • Affiliations:
  • Dept. of Comput. Sci., Univ. of North Carolina, Chapel Hill, NC, USA;-;-

  • Venue:
  • IEEE Transactions on Nanotechnology
  • Year:
  • 2003

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Abstract

We have simulated the behavior of a rod shaped nanoscale ring-gated field-effect transistor (RG-FET) using the PISCES-IIb semiconductor drift-diffusion solver. The results from these simulations are used by a customized SPICE 3f5 kernel to simulate several simple logic gates. The usefulness of this kind of transistor is examined within the context of a self-assembling fabrication technique that we outline.