Analysis of the Frequency Response of Carbon Nanotube Transistors

  • Authors:
  • D. Akinwande;G. F. Close;H. -S.P. Wong

  • Affiliations:
  • Dept. of Electr. Eng., Stanford Univ.;-;-

  • Venue:
  • IEEE Transactions on Nanotechnology
  • Year:
  • 2006

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Abstract

The characterizations of carbon nanotube transistors at high frequencies have so far been hindered by large parasitic and extrinsic capacitances. We present a quantitative analysis of the limitations imposed by probe pad parasitics on single-wall carbon nanotube transistor characterization at gigahertz frequencies. Our analysis reveals the various kinds of frequency responses that can be expected to be measured. Furthermore, we present design guidelines and a suitable device layout to achieve gain and bandwidth at gigahertz frequencies