Visually Servoed 3-D Alignment of Multiple Objects with Subnanometer Precision

  • Authors:
  • J. H. Kim;Chia-Hsiang Menq

  • Affiliations:
  • Dept. of Mech. Eng., Ohio State Univ., Columbus, OH;-

  • Venue:
  • IEEE Transactions on Nanotechnology
  • Year:
  • 2008

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Abstract

This paper presents a visual measurement technique and the associated visual servo control method that enable 3-D alignment of multiple objects with subnanometer precision. Such high precision is achieved through eliminating the bias error caused by spatial sampling in the in-plane motion estimation, using a highly sensitive measurement technique based on interference for the out-of-plane motion, and continuously compensating for time varying uncertainties induced by mechanical forces and thermal drifts. The developed measurement technique is integrated with a motion stage to experimentally demonstrate visually servoed 3-D alignment, in which two microcantilevers are aligned in the 3-D space with alignment errors below 1 nm (rms) in all axes. Nanostepping of 0.5 nm magnitude along the out-of-plane z-axis is also performed between the two microcantilevers to illustrate the super precision of the visually served 3-D alignment.