Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes
Journal of Electronic Testing: Theory and Applications
Hierarchical decoding of double error correcting codes for high speed reliable memories
Proceedings of the 50th Annual Design Automation Conference
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This paper discusses Innovative Silicon's development of the densest and cheapest embedded technology in the world which is called Z-RAM, for zero-capacitor dynamic random access memory. If Z-RAM grabs even a little piece of the on-chip memory market, it will change the ground rules for microprocessor design and quickly make Innovative Silicon a company to be reckoned with. This development is considered to be a success, because its technology could quintuple the amount of memory incorporated into microprocessor chips and make them both cheaper and faster