A protocol test generation procedure
Computer Networks and ISDN Systems
Computer networks
An improved protocol test generation procedure based on UIOS
SIGCOMM '89 Symposium proceedings on Communications architectures & protocols
An optimization technique for protocol conformance testing using multiple UIO sequences
Information Processing Letters
The synchronization problem in protocol testing and its complexity
Information Processing Letters
Test Selection Based on Finite State Models
IEEE Transactions on Software Engineering
Formal methods for test sequence generation
Computer Communications
Synchronizable test sequences based on multiple UIO sequences
IEEE/ACM Transactions on Networking (TON)
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
IEEE Transactions on Software Engineering
Generating Synchronizable Test Sequences Based on Finite State Machine with Distributed Ports
Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems VI
Testing Software Design Modeled by Finite-State Machines
IEEE Transactions on Software Engineering
Research: Synchronizable test sequence generation using UIO sequences
Computer Communications
Proceedings of the 2006 ACM symposium on Applied computing
Minimizing coordination channels in distributed testing
FORTE'06 Proceedings of the 26th IFIP WG 6.1 international conference on Formal Techniques for Networked and Distributed Systems
Testing input/output partial order automata
TestCom'07/FATES'07 Proceedings of the 19th IFIP TC6/WG6.1 international conference, and 7th international conference on Testing of Software and Communicating Systems
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Testing if a multi-party protocol implementation conforms to the specification is achieved by a testing system with k testers (where k=2), among which synchronization problems are encountered. This paper proposes a new model for test sequence generation, which considers both the costs of input/output operations and external synchronization operations. The multiplex digraph model is transformed from a given finite state machine representation of the protocol (with n states, m transitions and k is considered as constant) using an O(m^2) algorithm, and can represent the testing process cost of an arbitrarily-configured testing system. Application of the model includes: (1) an O(m^2) algorithm for generating the minimum-cost synchronizable transfer sequence, improving an earlier exponential-time backtracking algorithm; (2) an O(m^2) algorithm for generating the synchronizable test sequence based on the T-method, improving an earlier exponential-time backtracking algorithm; (3) an O(n.m^2) algorithm for generating the synchronizable test sequence based on the overlapping U-method, which is an uninvestigated result even for k=2.