A probabilistic model for image representation via multiple patterns

  • Authors:
  • Jun Li;Dacheng Tao;Xuelong Li

  • Affiliations:
  • Centre for Quantum & Intelligent Systems, University of Technology, Sydney, 235 Jones Street Ultimo, Sydney, NSW 2007, Australia;Centre for Quantum & Intelligent Systems, University of Technology, Sydney, 235 Jones Street Ultimo, Sydney, NSW 2007, Australia;Center for OPTical IMagery Analysis and Learning (OPTIMAL), State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, ...

  • Venue:
  • Pattern Recognition
  • Year:
  • 2012

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Abstract

For image analysis, an important extension to principal component analysis (PCA) is to treat an image as multiple samples, which helps alleviate the small sample size problem. Various schemes of transforming an image to multiple samples have been proposed. Although having been shown effective in practice, the schemes are mainly based on heuristics and experience. In this paper, we propose a probabilistic PCA model, in which we explicitly represent the transformation scheme and incorporate the scheme as a stochastic component of the model. Therefore fitting the model automatically learns the transformation. Moreover, the learned model allows us to distinguish regions that can be well described by the PCA model from those that need further treatment. Experiments on synthetic images and face data sets demonstrate the properties and utility of the proposed model.