Minimum average cost testing for partially ordered components

Authors:
M. J. Lipman;J. Abrahams
Affiliations:
Div. of Math., Comput. & Inf. Sci., Office of Naval Res., Arlington, VA;-
Venue:
IEEE Transactions on Information Theory
Year:
1995

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Abstract

The problem of designing a sequence of optimal binary tests for the identification of a single faulty component is addressed. For components in linear order this is equivalent to the classical alphabetic coding problem solved by Hu and Tucker (1971). For partially ordered components the problem is solved by reduction to a minimization over a set of alphabetic problems