Fault tolerance design for large-scale optical switches

  • Authors:
  • Yu Dong;Jian Wang

  • Affiliations:
  • Department of Electrical and Computer Engineering, Florida International University, Miami, FL, United States;Department of Electrical and Computer Engineering, Florida International University, Miami, FL, United States

  • Venue:
  • Optical Switching and Networking
  • Year:
  • 2008

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Abstract

In this paper, we present an enhanced fault tolerance in large-scale optical switches through innovations in architecture and control logic design. A large-scale switch is constructed from a network of 2x2 optical switch elements (SEs). Classic switch network architectures, such as the Benes, are not designed with fault tolerance in mind. There are three major contributions in this paper: (1) we developed an analytical method, referred to as the probability accumulation method, to calculate the average connection blocking probability in a faulty switch network; (2) we provided a failure-aware routing algorithm to effectively circumvent connections from defected SEs in a dilated Benes switch; and (3) we improved the connectivity pattern of the Benes network to further reduce the blocking probability, especially when the SE failure rate is low.