Self-Implicating Structures for Diagnosable Systems
IEEE Transactions on Computers
System-level fault diagnosis: A survey
Microprocessing and Microprogramming - Fault tolerant computing
A O(t3+ |E| ) Fault Identification Algorithm for Diagnosable Systems
IEEE Transactions on Computers - Fault-Tolerant Computing
Diagnosability issues in multiprocessor systems
Diagnosability issues in multiprocessor systems
A Characterization of t/s-Diagnosability and Sequential t-Diagnosability in Designs
IEEE Transactions on Computers
Sequential Diagnosability is Co-NP Complete
IEEE Transactions on Computers
The consensus problem in fault-tolerant computing
ACM Computing Surveys (CSUR)
(t, k)-Diagnosable System: A Generalization of the PMC Models
IEEE Transactions on Computers
(t, k) - Diagnosis for Matching Composition Networks under the MM* Model
IEEE Transactions on Computers
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In the system-level fault diagnosis area, the fundamental problem of characterizing sequentially $t$-diagnosable systems in the PMC model has remained open for more than two decades. We resolve this problem by providing a complete characterization of such systems. Our solution to the characterization problem leads to the correct identification of optimal sequentially $t$-diagnosable $D_{\delta,k}$ systems. Given a set of $n$ units where $n = 2t + 1$, an optimal $D_{\delta,k}$ system can be constructed with just $n(\lfloor(t + 2)/3\rfloor)$ tests, rather than $n(\lfloor t/2\rfloor + 1)$ tests驴a previously misjudged bound. An efficient algorithm for identifying the set of faulty units in a sequentially $t$-diagnosable $D_{\delta,k}$ system is given along the line of the proposed characterization, which is linear with respect to the number of tests in the system.Index Terms驴Consistent fault sets, $D_{\delta,k}$ systems, fault diagnosis, PMC model, sequentially diagnosable systems, syndrome, test assignment.