A fault identification algorithm for ti-diagnosable systems
IEEE Transactions on Computers - The MIT Press scientific computation series
A O(t3+ |E| ) Fault Identification Algorithm for Diagnosable Systems
IEEE Transactions on Computers - Fault-Tolerant Computing
Dynamic Fault Reconfiguration in a Mesh-Connected MIMD Environment
IEEE Transactions on Computers
The PMC System Level Fault Model: Cardinality Properties of the Implied Faulty Sets
IEEE Transactions on Computers
IEEE Transactions on Computers
On Self-Diagnosable Multiprocessor Systems: Diagnosis by the Comparison Approach
IEEE Transactions on Computers
The consensus problem in fault-tolerant computing
ACM Computing Surveys (CSUR)
Sequentially t-Diagnosable Systems: A Characterization and Its applications
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Local diagnostication in computer systems with the circulant structure
Automation and Remote Control
Probabilistic diagnosis of clustered faults for shared structures
Mathematical and Computer Modelling: An International Journal
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In this paper, a new class of diagnosable systems, called tp-self-implicating systems, which is a special case of the well-known tp-diagnosable systems introduced by Preparata et al. [1], is described. If there are no more than tp faulty units and the faults are assumed to be permanent, then the faulty units in a tp-self-implicating system can always be identified using at least one of two straight forward criteria associated with test outcomes. In each case, the given faulty unit in effect implicates itself as faulty. Necessary and sufficient conditions are given on the structures of PMC models for self-implication. Finally, an algorithm for identifying the set of faulty units in a tp-self-implicating system is given which is linear in the number of tests in the system, rendering it more efficient than the most efficient known algorithm for the general class of tp-diagnosable systems.