Local diagnostication in computer systems with the circulant structure

  • Authors:
  • Yu. K. Dimitriev

  • Affiliations:
  • Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia

  • Venue:
  • Automation and Remote Control
  • Year:
  • 2007

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Abstract

Studies are made of the possibility of diagnostication at the system level. The objects of the investigation are multiprocess fail-safe systems with the circulant diagnostic structure, in which the t-multiple failures at the level of processing modules are accepted. The results (outcomes) of the testing correspond to the known model of Preparata, Metze, and Chien. Conditions are found at which the technical state of each processing module can be defined on the basis of the analysis of the results of its testing only from adjacent modules.