Self-Implicating Structures for Diagnosable Systems
IEEE Transactions on Computers
The Design and Analysis of Computer Algorithms
The Design and Analysis of Computer Algorithms
Characterization of Connection Assignment of Diagnosable Systems
IEEE Transactions on Computers
On Fault Identification in Diagnosable Systems
IEEE Transactions on Computers
Diagnosable Systems for Intermittent Faults
IEEE Transactions on Computers
An 0(n2.5) Fault Identification Algorithm for Diagnosable Systems
IEEE Transactions on Computers
Diagnosis Without Repair for Hybrid Fault Situations
IEEE Transactions on Computers
Greedy Diagnosis of Hybrid Fault Situations
IEEE Transactions on Computers
An Efficient Fault Diagnosis Algorithm for Symmetric Multiple Processor Architectures
IEEE Transactions on Computers
A Generalized Theory for System Level Diagnosis
IEEE Transactions on Computers
A Distributed Algorithm for Fault Diagnosis in Systems with Soft Failures
IEEE Transactions on Computers
Efficient Diagnosis of Multiprocessor Systems Under Probabilistic Models
IEEE Transactions on Computers
Intermittent Fault Diagnosis in Multiprocessor Systems
IEEE Transactions on Computers
Probabilistic diagnosis of multiprocessor systems
ACM Computing Surveys (CSUR)
Hybrid Fault Diagnosability with Unreliable Communication Links
IEEE Transactions on Computers
On Probabilistic Diagnosis of Multiprocessor Systems Using Multiple Syndromes
IEEE Transactions on Parallel and Distributed Systems
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In this paper, a new approach to identifying faulty units in ti-diagnosable systems is described. This approach exploits special properties of the highly structured ti-diagnosable systems to produce a faulty unit identification algorithm which is shown to be of time complexity O(|E|) where |E| corresponds to the number of tests in the system. The diagnosis quality of the algorithm is as follows: 1) if the algorithm identifies a unit as faulty, it is always correct; 2) if the collection of test outcomes takes on a form that is compatible with a permanent fault situation, the algorithm identifies all of the corresponding faulty units; and 3) the algorithm identifies at least one faulty unit over collections of test outcomes significantly larger than those that are compatible with permanent fault situations.