Application-independent testing of FPGA interconnects

Authors:
M. B. Tahoori;S. Mitra
Affiliations:
Center for Reliable Comput., Stanford Univ., CA, USA;-
Venue:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year:
2006

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Abstract

We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.