High-Quality Transition Fault ATPG for Small Delay Defects

  • Authors:

  • M. M.V. Kumar;S. Tragoudas

  • Affiliations:

  • Dept. of Electr. & Comput. Eng, Southern Illinois Univ., Carbondale, IL;-

  • Venue:
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Year:
  • 2007

Quantified Score

Hi-index 0.03

Visualization

Abstract

A new framework is proposed to generate compact quality tests to detect small delay defects by activating and propagating transition faults only along implicitly kept sensitizable critical paths. It is shown how to implicitly generate functions to derive tests for the proposed framework. The novelty of the method relies on a multivalued algebra that is used to generate the test functions with a single circuit traversal, independent of the number of critical paths. Experimental results demonstrate the effectiveness of the method