Statistical texture characterization from discrete wavelet representations

  • Authors:
  • G. Van de Wouwer;P. Scheunders;D. Van Dyck

  • Affiliations:
  • Dept. of Phys., Antwerp Univ.;-;-

  • Venue:
  • IEEE Transactions on Image Processing
  • Year:
  • 1999

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Abstract

We conjecture that texture can be characterized by the statistics of the wavelet detail coefficients and therefore introduce two feature sets: (1) the wavelet histogram signatures which capture all first order statistics using a model based approach and (2) the wavelet co-occurrence signatures, which reflect the coefficients' second-order statistics. The introduced feature sets outperform the traditionally used energy. Best performance is achieved by combining histogram and co-occurrence signatures