Thresholding in edge detection: a statistical approach

Authors:
R. R. Rakesh;P. Chaudhuri;C. A. Murthy
Affiliations:
American Express, Gurgaon, India;-;-
Venue:
IEEE Transactions on Image Processing
Year:
2004

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Abstract

Many edge detectors are available in image processing literature where the choices of input parameters are to be made by the user. Most of the time, such choices are made on an ad-hoc basis. In this article, an edge detector is proposed where thresholding is performed using statistical principles. Local standardization of thresholds for each individual pixel (local thresholding), which depends upon the statistical variability of the gradient vector at that pixel, is done. Such a standardized statistic based on the gradient vector at each pixel is used to determine the eligibility of the pixel to be an edge pixel. The results obtained from the proposed method are found to be comparable to those from many well-known edge detectors. However, the values of the input parameters providing the appreciable results in the proposed detector are found to be more stable than other edge detectors and possess statistical interpretation.